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            TetraMAX 2-OSM testATPG培训班
   入.学.要.求

        学员学习本课程应具备下列基础知识:
        ◆ 有数字电路设计和硬件描述语言的基础或自学过相关课程。

   班.级.规.模.及.环.境
       坚持小班授课,为保证培训效果,增加互动环节,每期人数限3到5人。
   上课时间和地点
上课地点:【上海】:同济大学(沪西)/新城金郡商务楼(11号线白银路站) 【深圳分部】:电影大厦(地铁一号线大剧院站)/深圳大学成教院 【北京分部】:北京中山/福鑫大楼 【南京分部】:金港大厦(和燕路) 【武汉分部】:佳源大厦(高新二路) 【成都分部】:领馆区1号(中和大道) 【沈阳分部】:沈阳理工大学/六宅臻品 【郑州分部】:郑州大学/锦华大厦 【石家庄分部】:河北科技大学/瑞景大厦 【广州分部】:广粮大厦 【西安分部】:协同大厦
最近开课时间(周末班/连续班/晚班)
TetraMAX 2-OSM testATPG:2024年1月8日(请抓紧报名)
   实验设备
     ☆资深工程师授课

        
        ☆注重质量
        ☆边讲边练

        ☆合格学员免费推荐工作


        专注高端培训17年,曙海提供的课程得到本行业的广泛认可,学员的能力
        得到大家的认同,受到用人单位的广泛赞誉。

        ★实验设备请点击这儿查看★
   .最.新.优.惠.
       ◆在读学生凭学生证,可优惠500元。
   .质.量.保.障.

        1、培训过程中,如有部分内容理解不透或消化不好,可免费在以后培训班中重听;
        2、培训结束后免费提供半年的技术支持,充分保证培训后出效果;
        3、培训合格学员可享受免费推荐就业机会。

             TetraMAX 2-OSM testATPG培训班

 

Overview
This workshop discusses at-speed faults and how to use TetraMAX for at-speed test. Topics include description, recommendation, and scripts of transition, small-delay defect, and path-delay fault model ATPG. Also covered are the Onchip Clock Controller (OCC) flow, which leverages the PLL fast clocks, and using PrimeTime to generate the necessary data for at-speed test. Hands-on labs follow each training module, allowing you to apply the skills learned in lecture. Labs include: using PrimeTime to generate the necessary files for at-speed ATPG; generating the patterns for different fault models in Tetramax; and, finally, using VCS for simulating the patterns generated. Objectives At the end of this workshop the student should be able to:
  • Describe the need for At-Speed testing
  • List the At-Speed fault models available
  • Describe the two launch techniques for at-speed faults
  • Successfully edit a stuck-at SPF file to suit at-speed fault model
  • Define the timing exceptions
  • Automate the process of script generation for TetraMAX, using PrimeTime. This script will take care of the false and multi-cycle paths
  • Modify a given stuck-at fault model script to run for an at-speed fault model
  • State the steps required to merge transition and stuck-at fault patterns to reduce the overall patterns
  • Automatically create scripts that can be used in PrimeTime to perform test mode STA
  • Describe the SDD flow
  • Describe the flow needed to successfully use the PLL present in your design to give the at-speed clock during capture mode
  • State the steps needed to perform path-delay ATPG
  • Understand the fault classification in path-delay ATPG
Audience Profile
Engineers who use ATPG tools to generate patterns for different fault models.Prerequisites
To benefit the most from the material presented in this workshop, you should: A. Have taken the TetraMAX 1 workshop. OR B. Possess knowledge in the following areas:
  • Scan Architecture and ATPG
  • Stuck-At fault model ATPG with TetraMAX
  • SPF file
Course Outline Module 1
  • Introduction of At-Speed defects
  • Source of Test Escapes and chip failure
  • Requirements for At-Speed testing
  • Popular fault models for At-Speed testing
Module 2
  • Transition Fault model
  • Path Delay Fault model
  • At-Speed Fault Detection Method
  • Techniques to Launch and Capture a Fault
Module 3
  • STIL file
  • Modifications to STIL file for At-Speed testing
  • Generic Capture Procedures
Module 4
  • Timing Exceptions
  • Automated Way to Generate Timing Exceptions form PrimeTime
Module 5
  • TetraMAX Scripts for Transition ATPG
  • Design Guidelines
  • Flow Considerations and Requirements
  • Pattern Merging
  • Automated way to generate the scripts for PrimeTime to perform testmode STA
Module 6
  • What is a Small Delay Defect ATPG
  • How to use PrimeTime to Generate the Slack Data
  • ATPG Flow in TetraMAX
Module 7
  • Requirement of PLL for At-speed faults
  • The various clocks in PLL flow
  • Use QuickSTIL to generate the SPF
Module 8
  • TetraMAX scripts for Path Delay ATPG
  • Fault Classification for Path Delay Faults
  • Generating Paths for TetraMAX Using PrimeTime
  • Reconvergence Paths
  • Hazard Simulation
Module 9
  • Conclusion
  • Topics Covered
  • Fault model and Features of TetraMAX
  • Solvnet Resources